Publicações

Rtl Test Pattern Generation for High Quality Loosely Deterministic Bist

AuthID
P-000-JG7

Author(s)

Santos, MB

Fernandes, JM

Teixeira, IC

Teixeira, JP

Tipo de Documento

Proceedings Paper

Year published

2003

Publicado

in DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, PROCEEDINGS, ISSN: 1530-1591

Páginas: 994-999 (6)

Conference

Design, Automation and Test in Europe Conference and Exhibition (Date 03), Date: MAR 03-07, 2003, Location: MUNICH, GERMANY, Patrocinadores: EDAA, EDA Consortium, IEEE Comp Soc, TTTC, IEEE Comp Soc, DATC, ECSI, ACM/SIGDA, RAS

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Publication Identifiers

DOI: 10.1109/date.2003.1253734

SCOPUS: 2-s2.0-3042641122

Wos: WOS:000182683800157

Source Identifiers

ISSN: 1530-1591

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Rtl Test Pattern Generation for High Quality Loosely Deterministic Bist

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