Application of Image Processing Techniques in the Characterization of Plant Leafs

AuthID
 P-000-KV1
1
Author(s)
Tipo de Documento
Proceedings Paper
Year published
2003
Publicado
in 2003 IEEE INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS, VOLS 1 AND 2
Volume: I, Páginas: 612-616 (5)
Conference
Ieee International Symposium on Industrial Electronics, Date: JUN 09-11, 2003, Location: RIO DE JANEIRO, BRAZIL, Patrocinadores: IEEE, ies, SICE, Coppe UFRJ
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Publication Identifiers
SCOPUS: 2-s2.0-84941152492
Wos: WOS:000188940100081
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