Sputter Depth Profiling of Mo/B4C/Si and Mo/Si Multilayer Nanostructures: A Round-Robin Characterization by Different Techniques

AuthID
 P-006-9NS
10
Author(s)
Ber, B
·
Babor, P
·
Brunkov, PN
·
Chapon, P
·
Drozdov, MN
·
Duda, R
·
Kazantsev, D
·
Polkovnikov, VN
·
Yunin, P
·
Tipo de Documento
Article
Year published
2013
Publicado
in THIN SOLID FILMS, ISSN: 0040-6090
Volume: 540, Páginas: 96-105 (10)
Indexing
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Scopus®
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Publication Identifiers
SCOPUS: 2-s2.0-84878172078
Wos: WOS:000321437400016
Source Identifiers
ISSN: 0040-6090
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