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Combined Spectral and Histogram Analysis for Fast Adc Testing

AuthID
P-000-23J

Author(s)

Serra, AC

da Silva, MF

Ramos, PM

Martins, RC

Michaeli, L

Saliga, J

Tipo de Documento

Article

Year published

2005

Publicado

in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, ISSN: 0018-9456

Volume: 54, Número: 4, Páginas: 1617-1623 (7)

Conference

21St Ieee Instrumentation and Measurement Technology Conference, Date: MAY 18-20, 2004, Location: Como, ITALY, Patrocinadores: IEEE Instrumentat & Measurement Soc

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Publication Identifiers

DOI: 10.1109/tim.2005.851057

SCOPUS: 2-s2.0-23344452098

Wos: WOS:000230628600043

Source Identifiers

ISSN: 0018-9456

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Combined Spectral and Histogram Analysis for Fast Adc Testing

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