Electrical and Transient Current Characterization of Edgeless Si Detectors Diced with Different Methods

AuthID
P-000-P5M
10
Author(s)
Li, Z
·
Eremin, V
·
Granata, V
·
Mendes, PR
·
Niinikoski, TO
·
Sousa, P
·
Verbitskaya, E
·
Zhang, W
Tipo de Documento
Article
Year published
2002
Publicado
in IEEE TRANSACTIONS ON NUCLEAR SCIENCE, ISSN: 0018-9499
Volume: 49, Número: 3, Páginas: 1040-1046 (7)
Conference
Ieee Nuclear Science Symposium, Date: NOV 04-10, 2001, Location: SAN DIEGO, CALIFORNIA, Patrocinadores: IEEE, Nucl Plasma Sci Soc
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-0036624431
Wos: WOS:000178671100039
Source Identifiers
ISSN: 0018-9499
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