Improved Mesfets Model Including Average Thermal Conditions, Breakdown, Sub-Threshold and Gate Diode On Operation

AuthID
 P-007-5GN
3
Author(s)
Joao Rosario, M
·
Gayral, M
·
Tipo de Documento
Proceedings Paper
Year published
1991
Publicado
in Conference Proceedings - European Microwave Conference
Volume: 2, Número: 21, Páginas: 1574-1579
Conference
Proceedings of the 21St Microwave Conference, Date: 9 September 1991 through 12 September 1991, Location: Stuttgart, Ger
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-0026384196
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