Stress Analysis of Titanium Dioxide Films by Raman Scattering and X-Ray Diffraction Methods

AuthID
 P-007-75D
2
Author(s)
4
Editor(es)
Gerberich,WW;Gao,H;Sundgren,JE;Baker,SP
Tipo de Documento
Review
Year published
1996
Publicado
in Materials Research Society Symposium - Proceedings, ISSN: 0272-9172
Volume: 436
Conference
Proceedings of the 1996 Mrs Spring Meeting, Date: 8 April 1996 through 12 April 1996, Location: San Francisco, CA, USA, Patrocinadores: MRS
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-0030379349
Source Identifiers
ISSN: 0272-9172
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