Characterizing Substrate Coupling in Deep-Submicron Designs

AuthID
P-000-Q4E
2
Author(s)
Vargas, N
Tipo de Documento
Article
Year published
2002
Publicado
in IEEE DESIGN & TEST OF COMPUTERS, ISSN: 0740-7475
Volume: 19, Número: 2, Páginas: 4-15 (12)
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-0036494808
Wos: WOS:000174114800002
Source Identifiers
ISSN: 0740-7475
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