Cell Dynamics Simulations of Shear-Induced Alignment and Defect Annihilation in Stripe Patterns Formed by Block Copolymers

AuthID
 P-007-9RW
4
Author(s)
Ren, SR
·
Hamley, IW
·
Olmsted, PD
Tipo de Documento
Article
Year published
2001
Publicado
in PHYSICAL REVIEW E, ISSN: 1063-651X
Volume: 63, Número: 4, Páginas: 415031-415039 (9)
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Publication Identifiers
SCOPUS: 2-s2.0-0035304453
Wos: WOS:000168214900034
Source Identifiers
ISSN: 1063-651X
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