Interpretation of Double X-Ray Diffraction Peaks from Ingan Layers (Vol 79, Pg 1432, 2001)

AuthID
P-000-QM5
7
Author(s)
O'Donnell, KP
·
Sequeira, AD
·
Tipo de Documento
Correction
Year published
2002
Publicado
in APPLIED PHYSICS LETTERS, ISSN: 0003-6951
Volume: 80, Número: 2, Páginas: 337-337 (1)
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-79955990877
Wos: WOS:000173153800059
Source Identifiers
ISSN: 0003-6951
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