Absolute Distance Metrology with Frequency Sweeping Interferometry

AuthID
 P-007-EH5
2
Author(s)
1
Editor(es)
Decker J.E.Peng G.-S.
Tipo de Documento
Proceedings Paper
Year published
2005
Publicado
in Proceedings of SPIE - The International Society for Optical Engineering, ISSN: 0277-786X
Volume: 5879, Páginas: 1-10
Conference
Recent Developments in Traceable Dimensional Measurements Iii, Date: 31 July 2005 through 1 August 2005, Location: San Diego, CA, Patrocinadores: SPIE - The International Society for Optical Engineering
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Publication Identifiers
SCOPUS: 2-s2.0-29244480675
Source Identifiers
ISSN: 0277-786X
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