Precision of Adc Gain and Offset Error Estimation with the Standard Histogram Test

AuthID
 P-007-H2Y
2
Author(s)
Tipo de Documento
Proceedings Paper
Year published
2005
Publicado
in Conference Record - IEEE Instrumentation and Measurement Technology Conference, ISSN: 1091-5281
Volume: 1, Páginas: 282-286
Conference
Imtc'05 - Proceedings of the Ieee Instrumentation and Measurement Technology Conference, Date: 16 May 2005 through 19 May 2005, Location: Ottawa, ON
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-33847185609
Source Identifiers
ISSN: 1091-5281
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