Fast Adc Testing by Spectral and Histogram Analysis

AuthID
 P-007-MF8
5
Author(s)
Da Silva, MF
·
Michaeli, L
·
Saliga, J
1
Editor(es)
Demidenko S.Ottoboni R.Petri D.Piuri V.Weng D.C.T.
Tipo de Documento
Proceedings Paper
Year published
2004
Publicado
in Conference Record - IEEE Instrumentation and Measurement Technology Conference, ISSN: 1091-5281
Volume: 2, Páginas: 823-828
Conference
Proceedings of the 21St Ieee Instrumentation and Measurement Technology Conference, Imtc/04, Date: 18 May 2004 through 20 May 2004, Location: Como, Patrocinadores: IEEE Instrumentation and Measurement Society
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-4644243883
Source Identifiers
ISSN: 1091-5281
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