in MACHINE VISION APPLICATIONS IN INDUSTRIAL INSPECTION X in PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE), ISSN: 0277-786X
Volume: 4664, Páginas: 198-206 (9)
Conference
Conference on Machine Vision Applications in Industrial Inspection X, Date: JAN 21-22, 2002, Location: SAN JOSE, CA, Patrocinadores: Soc Imaging Sci & Technol, SPIE