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On-Chip Small Capacitor Mismatches Measurement Technique Using Beta-Multiplier-Biased Ring Oscillator

AuthID
P-007-SCR

Author(s)

Sin, SW

Wei, HG

Chio, UF

Zhu, Y

U, SP

Martins, RP

Maloberti, F

Tipo de Documento

Proceedings Paper

Year published

2009

Publicado

in 2009 IEEE ASIAN SOLID-STATE CIRCUITS CONFERENCE (A-SSCC) in IEEE Asian Solid-State Circuits Conference Proceedings of Technical Papers

Páginas: 49-52 (4)

Conference

Ieee Asian Solid-State Circuits Conference (A-Sscc), Date: NOV 16-18, 2009, Location: Taipei, TAIWAN, Patrocinadores: IEEE Solid State Circuits Soc (IEEE SSCS), IEEE

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Metadata
Fontes

Publication Identifiers

DOI: 10.1109/asscc.2009.5357165

SCOPUS: 2-s2.0-76249098462

Wos: WOS:000298194200013

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On-Chip Small Capacitor Mismatches Measurement Technique Using Beta-Multiplier-Biased Ring Oscillator

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