Ge Nanocrystals in Alumina Matrix: a Structural Study

AuthID
 P-007-SW8
7
Author(s)
Kashtiban, RJ
·
Bangert, U
·
Harvey, AJ
4
Editor(es)
Walther, T; Nellist, PD; Hutchison, JL; Cullis, AG
Tipo de Documento
Proceedings Paper
Year published
2010
Publicado
in 16TH INTERNATIONAL CONFERENCE ON MICROSCOPY OF SEMICONDUCTING MATERIALS in Journal of Physics Conference Series, ISSN: 1742-6588
Volume: 209, Páginas: 012060 (4)
Conference
16Th International Conference on Microscopy of Semiconducting Materials, Date: MAR 17-20, 2009, Location: Univ Oxford, Oxford, ENGLAND, Patrocinadores: Royal Microscop Soc, Host: Univ Oxford
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Publication Identifiers
SCOPUS: 2-s2.0-77950498755
Wos: WOS:000283739100060
Source Identifiers
ISSN: 1742-6588
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