Publicações

A Comparison Between Voltage and True Power Based Embedded Measurements for Rf Testing

AuthID
P-007-V26

Author(s)

Mota, P

Da Silva, JM

Tipo de Documento

Proceedings Paper

Year published

2010

Publicado

in Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2010

Conference

2010 Ieee 16Th International Mixed-Signals, Sensors and Systems Test Workshop, Ims3Tw 2010, Date: 7 June 2010 through 9 June 2010, Location: Montpellier, La Grande Motte

Indexing

Scopus^®

Crossref^®

Google Scholar^®

Metadata
Fontes

Publication Identifiers

DOI: 10.1109/ims3tw.2010.5503003

SCOPUS: 2-s2.0-77955291162

Export Publication Metadata

Lista Marked

Adicionar à lista Marked

Info

At this moment we don't have any links to full text documens.

A Comparison Between Voltage and True Power Based Embedded Measurements for Rf Testing

Links Úteis

Ajuda

Autenticação Federada (Clique na imagem)

A Comparison Between Voltage and True Power Based Embedded Measurements for Rf Testing

Links Úteis

Ajuda