Evaluation of Rf Pa Nonlinearities Based on Cross-Correlation Between Current and Output Voltage

AuthID
 P-007-VWG
3
Author(s)
Veiga, R
Tipo de Documento
Proceedings Paper
Year published
2010
Publicado
in 5th Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2010
Conference
5Th Conference on Design and Technology of Integrated Systems in Nanoscale Era, Dtis 2010, Date: 23 March 2010 through 25 March 2010, Location: Hammamet, Patrocinadores: IEEE;Bebcom Technology;ST;IEEE Circuits and Systems Society (CAS)
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Publication Identifiers
SCOPUS: 2-s2.0-77957910910
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