Charge Trapping and Stability in Dielectrics Deduced from Isothermal and Non-Isothermal Measurements

AuthID
 P-000-S6M
2
Author(s)
Neaga, ER
1
Editor(es)
Fleming, RJ
Tipo de Documento
Proceedings Paper
Year published
2002
Publicado
in 11TH INTERNATIONAL SYMPOSIUM ON ELECTRETS (ISE 11)
Páginas: 110-113 (4)
Conference
11Th International Symposium on Electrets (Ise 11), Date: OCT 01-03, 2002, Location: MELBOURNE, AUSTRALIA, Patrocinadores: IEEE Dielect & Elect Insulat Soc, IEEE Ultrason & Frequency Control Soc
Indexing
Wos®
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-0036957328
Wos: WOS:000179971700027
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