Rbs Analysis of Mbe Grown Sige/(001)Si Heterostructures with Thin High Ge Content Sige Channels for Hmos Transistors

AuthID
 P-000-SDY
7
Author(s)
Sequeira, AD
·
Myronov, M
·
Mironov, OA
·
Phillips, PJ
·
Parker, EHC
Tipo de Documento
Article
Year published
2001
Publicado
in MODERN PHYSICS LETTERS B, ISSN: 0217-9849
Volume: 15, Número: 28-29, Páginas: 1297-1304 (8)
Conference
Workshop on Advanced Materials Produced and Analyzed with Ion Beams, Date: JUL 10-12, 2001, Location: WELLINGTON, NEW ZEALAND, Host: NATL MUSEUM NEW ZEALAND
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Publication Identifiers
SCOPUS: 2-s2.0-0035924758
Wos: WOS:000173764500005
Source Identifiers
ISSN: 0217-9849
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