Photo-Epr Studies on the Ab3 and Ab4 Nickel-Related Defects in Diamond

AuthID
 P-000-SMY
5
Author(s)
Gehlhoff, W
·
Bimberg, D
Tipo de Documento
Article
Year published
2001
Publicado
in PHYSICA B-CONDENSED MATTER, ISSN: 0921-4526
Volume: 308, Páginas: 589-592 (4)
Conference
21St International Conference on Defects in Semiconductors, Date: JUL 16-20, 2001, Location: GIESSEN, GERMANY
Indexing
Wos®
Scopus®
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Publication Identifiers
SCOPUS: 2-s2.0-0035670666
Wos: WOS:000173660100148
Source Identifiers
ISSN: 0921-4526
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