Publicações

Thickness Dependence of Structure and Piezoelectric Properties at Nanoscale of Polycrystalline Pzt Thin Films

AuthID
P-008-6Y3

Author(s)

Araujo, EB

Lima, EC

Bdikin, IK

Kholkin, AL

Tipo de Documento

Proceedings Paper

Year published

2012

Publicado

in Proceedings of 2012 21st IEEE Int. Symp. on Applications of Ferroelectrics held jointly with 11th IEEE European Conference on the Applications of Polar Dielectrics and IEEE PFM, ISAF/ECAPD/PFM 2012

Conference

2012 21St Ieee Int. Symp. on Applications of Ferroelectrics Held with 11Th Ieee European Conf. on Applications of Polar Dielectrics and 4Th Ieee Int. Symp on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials, Isaf/Ecapd/Pfm, Date: 9 July 2012 through 13 July 2012, Location: Aveiro, Patrocinadores: Ultrason., Ferroelectr. Freq. Control;(UFFC) Soc. Inst. Electr. Electron. Eng. (IEEE)

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