Rutherford Backscattering Analysis of Thin Films and Superlattices with Roughness

AuthID
P-000-TXE
1
Author(s)
Tipo de Documento
Article
Year published
2001
Publicado
in JOURNAL OF PHYSICS D-APPLIED PHYSICS, ISSN: 0022-3727
Volume: 34, Número: 14, Páginas: 2109-2116 (8)
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Publication Identifiers
SCOPUS: 2-s2.0-0035859496
Wos: WOS:000170361000007
Source Identifiers
ISSN: 0022-3727
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