In-Situ Tem Annealing of Nanocrystalline Copper Thin Films

AuthID
P-008-HFX
Tipo de Documento
Note
Year published
2007
Publicado
in Microscopy and Microanalysis, ISSN: 1431-9276
Volume: 13, Número: SUPPL.2, Páginas: 574-575
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-84888263561
Source Identifiers
ISSN: 1431-9276
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