Ion Temperature and X-Ray Line Width Measurements of Highly Charged Argon Ions in an Ecr Ion Source

AuthID
 P-008-HSQ
7
Author(s)
Gumberidze, A
·
Attard, J
·
Indelicato, P
Tipo de Documento
Article
Year published
2013
Publicado
in PHYSICA SCRIPTA, ISSN: 0031-8949
Volume: T156, Páginas: 014077 (3)
Conference
16Th International Conference on the Physics of Highly Charged Ions (Hci), Date: SEP 02-07, 2012, Location: Heidelberg, GERMANY, Patrocinadores: CAEN, Oerlikon Leybold Vacuum, RoentDek Handels, Struck Innovat Syst, Host: Ruprecht Karls Univ
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Publication Identifiers
SCOPUS: 2-s2.0-84888635439
Wos: WOS:000329022300078
Source Identifiers
ISSN: 0031-8949
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