Performance of Integrated Silicon Infrared Microspectrometers

AuthID
 P-008-PE3
4
Author(s)
Kong, SH
·
De Graaf, G
·
Tipo de Documento
Proceedings Paper
Year published
2003
Publicado
in Conference Record - IEEE Instrumentation and Measurement Technology Conference
Volume: 1, Páginas: 707-710
Conference
Proceedings of the 20Th Ieee Information and Measurement Technology Conference, Date: 20 May 2003 through 22 May 2003, Location: Vail, CO, Patrocinadores: IEEE Instrumentation and Measurment Society
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-0037831182
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