Automatic Test System For Inductive Components.

AuthID
P-008-R50
3
Author(s)
Santos Dinis, M
·
Fonseca Jose, A
·
Tipo de Documento
Proceedings Paper
Year published
1986
Publicado
Conference
Proceedings - Iecon '86: 1986 International Conference on Industrial Electronics, Control and Instrumentation. Industrial Applications of Mini, Micro & Personal Computers., Location: Milwaukee, WI, USA, Patrocinadores: IEEE Industrial Electronics Soc, New York, NY, USA;Soc of Instrument & Control Engineers of Japan, Jpn
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Publication Identifiers
SCOPUS: 2-s2.0-0022890336
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