Interferometric Measurements of Electric Field-Induced Displacements in Piezoelectric Thin Films

AuthID
 P-008-RTJ
4
Author(s)
Wutchrich, C
·
Taylor, DV
·
Setter, N
Tipo de Documento
Article
Year published
1996
Publicado
in REVIEW OF SCIENTIFIC INSTRUMENTS, ISSN: 0034-6748
Volume: 67, Número: 5, Páginas: 1935-1941 (7)
Indexing
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Scopus®
Crossref®297
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Publication Identifiers
SCOPUS: 2-s2.0-5244280905
Wos: WOS:A1996UK82800037
Source Identifiers
ISSN: 0034-6748
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