Piezoelectric Characterization of Pb(Zr,Ti)O-3 Thin Films by Interferometric Technique

AuthID
P-008-RTN
5
Author(s)
Tagantsev, AK
·
Brooks, KG
·
Taylor, DV
·
Setter, N
3
Editor(es)
Kulwicki, BM; Amin, A; Safari, A
Tipo de Documento
Proceedings Paper
Year published
1996
Publicado
in ISAF '96 - PROCEEDINGS OF THE TENTH IEEE INTERNATIONAL SYMPOSIUM ON APPLICATIONS OF FERROELECTRICS, VOLS 1 AND 2
Volume: 1, Páginas: 351-354 (4)
Conference
10Th Ieee International Symposium on Applications of Ferroelectrics (Isaf 96), Date: AUG 18-21, 1996, Location: E BRUNSWICK, NJ, Patrocinadores: IEEE, Ultrason Ferroelect & Frequency Control Soc, USN, Off Naval Res, Def Adv Res Project Agcy, Howatt Fdn
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-0030374425
Wos: WOS:A1996BH95D00065
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