Recessed Source Geometry For Source Excited X-Ray Fluorescence Analysis.

AuthID
 P-008-SZG
2
Author(s)
Tipo de Documento
Proceedings Paper
Year published
1986
Publicado
in Advances in X-Ray Analysis, ISSN: 0376-0308
Volume: 29, Páginas: 545-550
Conference
Advances in X-Ray Analysis., Location: Snowmass, CO, USA, Patrocinadores: Univ of Denver, Denver Research Inst, Denver, CO, USA;Joint Committee on Powder Diffraction Standards
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-0022988153
Source Identifiers
ISSN: 0376-0308
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