Modelling Of High Level Epidrain Effects In Vvmos Structures.

AuthID
P-008-XB9
2
Author(s)
Teixeria Pedro, LB
Tipo de Documento
Proceedings Paper
Year published
1983
Publicado
Conference
Proceedings of Melecon 83, Mediterranean Electrotechnical Conference., Location: Athens, Greece, Patrocinadores: IEEE Region 8
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Publication Identifiers
SCOPUS: 2-s2.0-0020942601
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