Light Intensity Exponents Ns Sensitive Tools for the Detection of Impurities in A-Si:h

AuthID
 P-008-XMN
7
Author(s)
Fonseca, LF
·
Weisz, SZ
·
Naides, R
·
Balberg, I
1
Editor(es)
Collins R.W.Branz H.M.Stutzmann M.Guha S.Okamoto H.
Tipo de Documento
Proceedings Paper
Year published
2000
Publicado
in Materials Research Society Symposium - Proceedings, ISSN: 0272-9172
Volume: 609, Páginas: A2751-A2756
Conference
Amorphous and Heterogeneus Silicon Thin Films-2000, Date: 24 April 2000 through 28 April 2000, Location: San Francisco, CA
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-0034431264
Source Identifiers
ISSN: 0272-9172
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