Microcrystallinity In Alpha -Si, Ge:h,F Alloys.

AuthID
 P-008-XNF
8
Author(s)
Shen, DS
·
Kolodzey, J
·
Slobodin, D
·
Lane, C
·
Campbell, IH
·
Fauchet, PM
·
Wagner, S
Tipo de Documento
Proceedings Paper
Year published
1986
Publicado
in Materials Research Society Symposia Proceedings, ISSN: 0272-9172
Volume: 70, Páginas: 301-306
Conference
Materials Issues in Amorphous Semiconductor Technology., Location: Palo Alto, CA, USA, Patrocinadores: Materials Research Soc, Pittsburgh, PA, USA
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-0022999651
Source Identifiers
ISSN: 0272-9172
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