Electrical and Tct Characterization of Edgeless Si Detectors Diced with Different Methods

AuthID
 P-008-YFY
10
Author(s)
Li, Z
·
Eremin, V
·
Granata, V
·
Mendes, PR
·
Niinikoski, TO
·
Sousa, P
·
Verbitskaya, E
·
Zhang, W
Tipo de Documento
Proceedings Paper
Year published
2001
Publicado
in IEEE Nuclear Science Symposium and Medical Imaging Conference
Volume: 1, Páginas: 202-206
Conference
2001 Ieee Nuclear Science Symposium Conference Record, Date: 4 November 2001 through 10 November 2001, Location: San Diege, CA, Patrocinadores: IEEE
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-0035554572
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