Publicações

High-Selectivity Single-Chip Spectrometer for Operation at Visible Wavelengths

AuthID
P-008-YJ9

Author(s)

Correia, JH

Bartek, M

Wolffenbuttel, RF

Editor(es)

Anon

Tipo de Documento

Proceedings Paper

Year published

1998

Publicado

in INTERNATIONAL ELECTRON DEVICES MEETING 1998 - TECHNICAL DIGEST, ISSN: 0163-1918

Páginas: 467-470 (4)

Conference

International Electron Devices Meeting (Iedm), Date: DEC 06-09, 1998, Location: SAN FRANCISCO, CA, Patrocinadores: Electron Devices Soc IEEE

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Fontes

Publication Identifiers

DOI: 10.1109/iedm.1998.746399

SCOPUS: 2-s2.0-0032255796

Wos: WOS:000078581800108

Source Identifiers

ISSN: 0163-1918

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High-Selectivity Single-Chip Spectrometer for Operation at Visible Wavelengths

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