Generating Reduced Order Models via Peec for Capturing Skin and Proximity Effects

AuthID
P-009-0J7
4
Author(s)
Kamon, M
·
Marques, N
·
White, J
1
Editor(es)
Anon
Tipo de Documento
Proceedings Paper
Year published
1997
Publicado
in ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING
Páginas: 259-262 (4)
Conference
6Th Topical Meeting on Electrical Performance of Electronic Packaging, Date: OCT 27-29, 1997, Location: SAN JOSE, CA, Patrocinadores: IEEE Microwave Theory & Tech Soc, IEEE Components Packaging & Mfg Technol Soc
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-0031335538
Wos: WOS:A1997BJ93U00058
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