A New Technique for the Investigation of Deep Levels on Irradiated Silicon Based on the Lazarus Effect

AuthID
 P-009-122
8
Author(s)
Mendes, PR
·
Eremin, V
·
Li, Z
·
Niinikoski, TO
·
Rodrigues, S
·
Sousa, P
·
Verbitskaya, E
1
Editor(es)
Metzler S.D.
Tipo de Documento
Proceedings Paper
Year published
2003
Publicado
in IEEE Nuclear Science Symposium Conference Record, ISSN: 1095-7863
Volume: 1, Páginas: 417-423
Conference
2003 Ieee Nuclear Science Symposium Conference Record - Nuclear Science Symposium, Medical Imaging Conference, Date: 19 October 2003 through 25 October 2003, Location: Portland, OR
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-11844284027
Source Identifiers
ISSN: 1095-7863
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