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Thickness and Roughness Measurements in Poly(O-Methoxyaniline) Layer-By-Layer Films Using Afm

AuthID
P-009-15J

Author(s)

Raposo, M

Lobo, RFM

Pereira da Silva, MA

Faria, RM

Oliveira, ON

Tipo de Documento

Article

Year published

1999

Publicado

in Proceedings - International Symposium on Electrets

Páginas: 533-536

Conference

10Th International Symposium on Electrets (Ise 10), Date: 22 September 1999 through 24 September 1999, Location: Delphi, Greece, Patrocinadores: IEEE Dielectrics and Electrical Insulation Society

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Publication Identifiers

DOI: 10.1109/ise.1999.832102

SCOPUS: 2-s2.0-0033340544

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Thickness and Roughness Measurements in Poly(O-Methoxyaniline) Layer-By-Layer Films Using Afm

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Thickness and Roughness Measurements in Poly(O-Methoxyaniline) Layer-By-Layer Films Using Afm

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