New Techniques For The Measurement of X-Ray Beam or X-Ray Optics Quality

AuthID
P-009-1VJ
31
Author(s)
Zeitoun, P
·
Balcou, P
·
Bucourt, S
·
Benredjem, D
·
Delmotte, F
·
Dovillaire, G
·
Douillet, D
·
Dunn, J
·
Faivre, G
·
[+11]·
Morlens, AS
·
Naulleau, PP
·
Remond, C
·
Rocca, JJ
·
Sebban, S
·
Smith, RF
·
Ravet, MF
·
Troussel, P
·
Valentin, C
·
Vanbostal, L
2
Editor(es)
Fill,EE;Suckewer,S
Tipo de Documento
Proceedings Paper
Year published
2003
Publicado
in Proceedings of SPIE - The International Society for Optical Engineering, ISSN: 0277-786X
Volume: 5197, Páginas: 194-204
Conference
Soft X-Ray Lasers and Applications V, Date: 6 August 2003 through 7 August 2003, Location: San Diego, CA, Patrocinadores: SPIE - The International Society for Optical Engineering
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-11144356055
Source Identifiers
ISSN: 0277-786X
Export Publication Metadata
Info
At this moment we don't have any links to full text documens.
Name Order Nome   Name Order Nome   Name Order Nome
1 Zeitoun, P;   2 Balcou, P;   3 Bucourt, S;
4 Benredjem, D;   5 Delmotte, F;   6 Dovillaire, G;
7 Douillet, D;   8 Dunn, J;   9 Faivre, G;
10 Fajardo, M ;   11 Goldberg, KA;   12 Idir, M;
13 Hubert, S;   14 Hunter, JR;   15 Jacquemot, S;
16 Kazamias, S;   17 Le Pape, S;   18 Levecq, X;
19 Lewis, CLS;   20 Marmoret, R;   21 Mercere, P;
22 Morlens, AS;   23 Naulleau, PP;   24 Remond, C;
25 Rocca, JJ;   26 Sebban, S;   27 Smith, RF;
28 Ravet, MF;   29 Troussel, P;   30 Valentin, C;
31 Vanbostal, L;