Electrical Behaviour Associated with Defect Tails in Germanium Implanted Silicon

AuthID
 P-009-2TT
7
Author(s)
Nejim, A
·
Gwilliam, RM
·
Emerson, NG
·
Knights, AP
·
Cristiano, F
·
Jeynes, C
Tipo de Documento
Proceedings Paper
Year published
1999
Publicado
in Proceedings of the International Conference on Ion Implantation Technology
Volume: 1, Páginas: 506-509
Conference
Proceedings of the 1998 International Conference on 'Ion Implantation Technology' Proceedings (Iit'98), Date: 22 June 1998 through 26 June 1998, Location: Kyoto, Jpn
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-0033331042
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