Publicações

High Depth Resolution Rutherford Backscattering Analysis of Si-Si0.78Ge0.22/(0 0 1)Si Superlattices

AuthID
P-009-2V5

Author(s)

Barradas, NP

Jeynes, C

Mironov, OA

Phillips, PJ

Parker, EHC

Tipo de Documento

Article

Year published

1998

Publicado

in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ISSN: 0168-583X

Volume: 139, Número: 1-4, Páginas: 239-243 (5)

Conference

5Th European Conference on Accelerators in Applied Research and Technology (Ecaart5), Date: AUG 26-30, 1997, Location: EINDHOVEN, NETHERLANDS, Host: EINDHOVEN UNIV

Indexing

Wos^®

Scopus^®

Crossref^®

Google Scholar^®

Metadata
Fontes

Publication Identifiers

DOI: 10.1016/s0168-583x(97)00965-8

SCOPUS: 2-s2.0-0032043003

Wos: WOS:000074586200036

Source Identifiers

ISSN: 0168-583X

Export Publication Metadata

Lista Marked

Adicionar à lista Marked

Info

At this moment we don't have any links to full text documens.

High Depth Resolution Rutherford Backscattering Analysis of Si-Si0.78Ge0.22/(0 0 1)Si Superlattices

Links Úteis

Ajuda

Autenticação Federada (Clique na imagem)

High Depth Resolution Rutherford Backscattering Analysis of Si-Si0.78Ge0.22/(0 0 1)Si Superlattices

Links Úteis

Ajuda