Identification of Planar Defects in D0(19) Phases Using High-Resolution Transmission Electron Microscopy

AuthID
 P-009-2Y9
3
Author(s)
Kooi, BJ
·
Tipo de Documento
Article
Year published
2001
Publicado
in PHILOSOPHICAL MAGAZINE LETTERS, ISSN: 0950-0839
Volume: 81, Número: 10, Páginas: 697-707 (11)
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Publication Identifiers
SCOPUS: 2-s2.0-0035494773
Wos: WOS:000171018600003
Source Identifiers
ISSN: 0950-0839
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