Radiation Test Results on First Silicon in the Design Against Radiation Effects (Dare) Library

AuthID
P-009-308
10
Author(s)
Redant, S
·
Marec, R
·
Baguena, L
·
Liegeon, E
·
Van Thielen, B
·
Beeckman, G
·
Fernandez Leon, A
·
Glass, B
Tipo de Documento
Proceedings Paper
Year published
2005
Publicado
in IEEE Transactions on Nuclear Science, ISSN: 0018-9499
Volume: 52, Número: 5 II, Páginas: 1550-1554
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-29144527508
Source Identifiers
ISSN: 0018-9499
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