Raman Characterization of Te Inclusions on Cdte Surface Using Visible Lasers

AuthID
 P-000-XTV
2
Author(s)
do Carmo, MC
1
Editor(es)
Andrews, DL
Tipo de Documento
Proceedings Paper
Year published
2001
Publicado
in RAMAN SPECTROSCOPY AND LIGHT SCATTERING TECHNOLOGIES IN MATERIALS SCIENCE in PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE), ISSN: 0277-786X
Volume: 4469, Páginas: 57-61 (5)
Conference
Conference on Raman Spectroscopy and Light Scattering Technologies in Materials Science, Date: JUL 31-AUG 01, 2001, Location: SAN DIEGO, CA, Patrocinadores: SPIE
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Publication Identifiers
SCOPUS: 2-s2.0-0035765494
Wos: WOS:000173644800007
Source Identifiers
ISSN: 0277-786X
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