Local Detection of X-Ray Spectroscopies with an In-Situ Atomic Force Microscope

AuthID
P-009-DZ9
6
Author(s)
Dhez, O
·
Le Denmat, S
·
Chevrier, J
·
Felici, R
·
Comin, F
Tipo de Documento
Article
Year published
2008
Publicado
in JOURNAL OF INSTRUMENTATION, ISSN: 1748-0221
Volume: 3, Número: 12, Páginas: P12004-P12004 (12)
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-62749180236
Wos: WOS:000265877900004
Source Identifiers
ISSN: 1748-0221
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