Boron Deposition on the Graphite Tiles of the Rfx Device Studied by Secondary Ion Mass Spectrometry

AuthID
 P-009-E3C
2
Author(s)
Ghezzi, F
·
Tipo de Documento
Article
Year published
2008
Publicado
in JOURNAL OF NUCLEAR MATERIALS, ISSN: 0022-3115
Volume: 373, Número: 1-3, Páginas: 402-406 (5)
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Publication Identifiers
SCOPUS: 2-s2.0-37549001793
Wos: WOS:000253059100052
Source Identifiers
ISSN: 0022-3115
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