In Situ Observation of the Elastic Deformation of a Single Epitaxial Sige Crystal by Combining Atomic Force Microscopy and Micro X-Ray Diffraction

AuthID
P-009-EGR
10
Author(s)
Scheler, T
·
Mocuta, C
·
Malachias, A
·
Magalhaes Paniago, R
·
Dhez, O
·
Comin, F
·
Metzger, TH
·
Chevrier, J
Document Type
Article
Year published
2009
Published
in JOURNAL OF APPLIED PHYSICS, ISSN: 0021-8979
Volume: 106, Issue: 10, Pages: 103525 (6)
Indexing
Publication Identifiers
Scopus: 2-s2.0-71749085253
Wos: WOS:000272932300037
Source Identifiers
ISSN: 0021-8979
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