Electron Impact Ionization of Ccl4 and Sf6 Embedded in Superfluid Helium Droplets

AuthID
 P-009-EQA
8
Author(s)
Schobel, H
·
Dampc, M
·
Mauracher, A
·
Mark, TD
·
Scheier, P
Tipo de Documento
Article
Year published
2009
Publicado
in INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, ISSN: 1387-3806
Volume: 280, Número: 1-3, Páginas: 26-31 (6)
Indexing
Wos®
Scopus®
Crossref®15
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-58149486645
Wos: WOS:000263195500005
Source Identifiers
ISSN: 1387-3806
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