Sources of Contamination to Weak Lensing Tomography: Redshift-Dependent Shear Measurement Bias

AuthID
 P-009-ES5
4
Author(s)
Van Waerbeke, L
·
Heymans, C
Tipo de Documento
Article
Year published
2009
Publicado
in Monthly Notices of the Royal Astronomical Society, ISSN: 0035-8711
Volume: 397, Número: 2, Páginas: 608-622
Indexing
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Publication Identifiers
SCOPUS: 2-s2.0-67651087203
Source Identifiers
ISSN: 0035-8711
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