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Scaling of Thermoelectric Voltage Induced by Microwave Radiation at the Boundary Between 2D Electron Systems

AuthID
P-009-F17

Author(s)

Larkin, IA

Kalmanovitz, NR

Hoxha, I

Jin, Y

Vitkalov, SA

Sarachik, MP

Klapwijk, TM

Caldas, M

Studart, N

Tipo de Documento

Proceedings Paper

Year published

2009

Publicado

in AIP Conference Proceedings, ISSN: 0094-243X

Volume: 1199, Páginas: 215-216

Conference

29Th International Conference on Physics of Semiconductors, Icps 29, Date: 27 July 2008 through 1 August 2008, Location: Rio de Janeiro, Patrocinadores: IUPAP;CNPQ;CAPES;FAPESP

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Publication Identifiers

DOI: 10.1063/1.3295375

SCOPUS: 2-s2.0-74849127779

Source Identifiers

ISSN: 0094-243X

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Scaling of Thermoelectric Voltage Induced by Microwave Radiation at the Boundary Between 2D Electron Systems

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